✦ LIBER ✦

Determination of sputtering yields by a new procedure for depth profiling of multilayered structures

✍ Scribed by B. Navinšek; P. Panjan; A. Žabkar; J. Fine

No coin nor oath required. For personal study only.

📜 SIMILAR VOLUMES

Sputter deposition of multilayered struc

✍ B. Navinšek; J. Fine 📂 Article 📅 1986 🏛 Elsevier Science 🌐 English ⚖ 484 KB

Determination of the interface width of

✍ P Panjan; A Žabkar; B Navinšek 📂 Article 📅 1985 🏛 Elsevier Science 🌐 English ⚖ 199 KB

Quantification of sputter depth profiles

✍ R. Voigtmann; W. Moldenhauer 📂 Article 📅 1988 🏛 John Wiley and Sons 🌐 English ⚖ 579 KB

Determination of depth resolution parame

✍ A. Zalar; S. Hofmann 📂 Article 📅 1990 🏛 John Wiley and Sons 🌐 English ⚖ 251 KB

EFSA—a new evaluation method of the dept

✍ D. Marton; J. László; J. Giber; F.G. Rüdenauer 📂 Article 📅 1985 🏛 Elsevier Science 🌐 English ⚖ 387 KB

New nondestructive composition depth pro

✍ S.G. Konnikov; K.Ju. Pogrebitsky 📂 Article 📅 1990 🏛 Elsevier Science 🌐 English ⚖ 370 KB