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Determination of the interface width of thin multilayered structures using quartz oscillator microbalance depth profiling

✍ Scribed by P Panjan; A Žabkar; B Navinšek

Publisher: Elsevier Science
Year: 1985
Tongue: English
Weight: 199 KB
Volume: 124
Category: Article
ISSN: 0040-6090
DOI: 10.1016/0040-6090(85)90275-5

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