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Determination of porous silicon film parameters by polarized light reflectance measurements

โœ Scribed by P. Basmaji; V.S. Bagnato; V. Grivickas; G.I. Surdutovich; R. Vitlina

Book ID
107864167
Publisher
Elsevier Science
Year
1993
Tongue
English
Weight
371 KB
Volume
233
Category
Article
ISSN
0040-6090

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