Reflectance Measurements of Annealed Porous Silicon Implanted with Nitrogen by Plasma Immersion Ion Implantation

✍ Scribed by A.F. Beloto; M.D. Silva; J.R. Senna; C. Kuranaga; N.F. Leite; M. Ueda

• Publisher: John Wiley and Sons
• Year: 2002
• Tongue: English
• Weight: 140 KB
• Volume: 232
• Category: Article
• ISSN: 0370-1972
• DOI: 10.1002/1521-3951(200207)232:1<111::aid-pssb111>3.0.co;2-l