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Determination of lattice parameter and elastic properties of porous silicon by X-ray diffraction

✍ Scribed by K. Barla; R. Herino; G. Bomchil; J.C. Pfister; A. Freund

No coin nor oath required. For personal study only.

📜 SIMILAR VOLUMES

Determination of lattice parameters in t

✍ C. Bocchi; A. Bosacchi; C. Ferrari; S. Franchi; P. Franzosi; R. Magnanini; L. Na 📂 Article 📅 1996 🏛 Elsevier Science 🌐 English ⚖ 562 KB

Characterization of porous silicon layer

✍ A. Bensaid; G. Patrat; M. Brunel; F. de Bergevin; R. Hérino 📂 Article 📅 1991 🏛 Elsevier Science 🌐 English ⚖ 528 KB

X-ray measurement of elastic strain and

✍ B.G. Cohen 📂 Article 📅 1967 🏛 Elsevier Science 🌐 English ⚖ 367 KB

X-ray Diffraction Study of Thin Film Ela

✍ P. Villain; P. Goudeau; P.-O. Renault; K.F. Badawi 📂 Article 📅 2002 🏛 John Wiley and Sons 🌐 English ⚖ 114 KB 👁 2 views

Determination of Total Reflectivity and

✍ Novikov, N. N. ;Sushko, V. G. 📂 Article 📅 1998 🏛 John Wiley and Sons 🌐 English ⚖ 185 KB 👁 2 views

The lattice parameter and density of ber

✍ B Bellamy; T.W Baker; D.T Livey 📂 Article 📅 1962 🏛 Elsevier Science 🌐 English ⚖ 228 KB