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Determination of optical constants of solgel-derived inhomogeneous TiO_2 thin films by spectroscopic ellipsometry and transmission spectroscopy

✍ Scribed by Mosaddeq-ur-Rahman, Md. ;Yu, Guolin ;Krishna, Kalaga Murali ;Soga, Tetsuo ;Watanabe, Junji ;Jimbo, Takashi ;Umeno, Masayoshi


Book ID
115346805
Publisher
The Optical Society
Year
1998
Tongue
English
Weight
188 KB
Volume
37
Category
Article
ISSN
1559-128X

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Optical Constants of Polycrystalline Cd1
✍ K. Prasada Rao; O. Md. Hussain; B. Srinivasulu Naidu; P. Jayarama Reddy πŸ“‚ Article πŸ“… 1997 πŸ› John Wiley and Sons 🌐 English βš– 127 KB πŸ‘ 2 views

Spectroscopic ellipsometry has been used to determine the optical constants-complex dielectric constant (e\* = e 1 + e 2 ), refractive index (n), extinction coefficient (k), absorption coefficient (a) and normal incidence reflectivity (R)-of two-source vacuum-evaporated polycrystalline Cd 1 Γ€x Zn x