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Determination of local stress in PECVD nitride films

✍ Scribed by G. Gspan; R. Osredkar


Publisher
Elsevier Science
Year
1990
Tongue
English
Weight
174 KB
Volume
30
Category
Article
ISSN
0026-2714

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Processing and characterisation of PECVD
✍ Xiumiao Zhang; Koubao Ding; Ailing Yang; Diling Shao πŸ“‚ Article πŸ“… 1996 πŸ› John Wiley and Sons 🌐 English βš– 268 KB

Amorphous Si-N films are synthesised from an NH,/SiH, gas mixture by plasma-enhanced chemical vapour deposition (PECVD) at fixed radio frequency (13.56 MHz) and total gas pressure (3424 Torr). The variable process parameters and their ranges are: (i) substrate temperature, 200-400 "C; (ii) RF power