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Determination of lifetime and diffusion length in silicon solar cells by self-biased (photovoltage) capacitance measurements

✍ Scribed by Swarup, P.; Jain, V.K.

Book ID: 115479795
Publisher: IEEE
Year: 1982
Tongue: English
Weight: 338 KB
Volume: 3
Category: Article
ISSN: 0741-3106
DOI: 10.1109/edl.1982.25560

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