Diffusion length and lifetime determination in p-n junction solar cells and diodes by forward-biased capacitance measurements

✍ Scribed by Neugroschel, A.; Pao-Jung Chen; Shing-Chong Pao; Lindholm, F.A.

• Book ID: 114592700
• Publisher: IEEE
• Year: 1978
• Tongue: English
• Weight: 712 KB
• Volume: 25
• Category: Article
• ISSN: 0018-9383
• DOI: 10.1109/t-ed.1978.19111