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Measurement of minority carrier lifetime and diffusion length in silicon epitaxial layers by means of the photocurrent technique

✍ Scribed by J. Müller; H. Bernt; H. Reichl


Book ID
107856335
Publisher
Elsevier Science
Year
1978
Tongue
English
Weight
301 KB
Volume
21
Category
Article
ISSN
0038-1101

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