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Determination of lattice parameters at thin epitaxial layers by RHEED

✍ Scribed by Dr. A. Tempel; Dr. B. Schumann


Publisher
John Wiley and Sons
Year
1979
Tongue
English
Weight
382 KB
Volume
14
Category
Article
ISSN
0232-1300

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πŸ“œ SIMILAR VOLUMES


Precision lattice parameter measurements
✍ Dr. H.-G. BrΓΌhl πŸ“‚ Article πŸ“… 1978 πŸ› John Wiley and Sons 🌐 English βš– 268 KB πŸ‘ 1 views

## Precision Lattice Parameter Measurements of WE-Gap-Epitaxial Layers by the Wmweganregung" Method The "Umweganregung" technique according to a method described by SPOONER and WIL-SON was used for the accurate measurement of lattice parameters of (100) slice of VPEgrown layers of gallium phosphid

Parameters influencing theoretical deter
✍ RΓ³ΕΌyΕ‚o, J. K. ;Malinowska, I. ;Gross, J. πŸ“‚ Article πŸ“… 1980 πŸ› John Wiley and Sons 🌐 English βš– 413 KB

The purpose of the studies being carried out is to find some regularities of a general character which determine the relationship between the structures of the chromatographed substances and the composition of the mobile phase, i.e., between the log of the partition coefficient of the sample (A,), t