## Precision Lattice Parameter Measurements of WE-Gap-Epitaxial Layers by the Wmweganregung" Method The "Umweganregung" technique according to a method described by SPOONER and WIL-SON was used for the accurate measurement of lattice parameters of (100) slice of VPEgrown layers of gallium phosphid
β¦ LIBER β¦
Determination of lattice parameters at thin epitaxial layers by RHEED
β Scribed by Dr. A. Tempel; Dr. B. Schumann
- Publisher
- John Wiley and Sons
- Year
- 1979
- Tongue
- English
- Weight
- 382 KB
- Volume
- 14
- Category
- Article
- ISSN
- 0232-1300
No coin nor oath required. For personal study only.
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The purpose of the studies being carried out is to find some regularities of a general character which determine the relationship between the structures of the chromatographed substances and the composition of the mobile phase, i.e., between the log of the partition coefficient of the sample (A,), t