Determination of the interface structure of AgGaSe2/{100}-GaAs epitaxial layers by means of RHEED and etching methods

✍ Scribed by Dr. A. Tempel

• Publisher: John Wiley and Sons
• Year: 1985
• Tongue: English
• Weight: 113 KB
• Volume: 20
• Category: Article
• ISSN: 0232-1300
• DOI: 10.1002/crat.2170200730