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Determination of electron-diffusion length from photocurrent characteristics of the structure ITO/a-SiC:H(p-type)/a-Si:H/a-Si:H(n-type)/Pd

✍ Scribed by T. Serin; N. Serin


Publisher
Springer
Year
1994
Tongue
English
Weight
212 KB
Volume
59
Category
Article
ISSN
1432-0630

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