✦ LIBER ✦
Effect of generation-recombination centers on the stress-dependence of Si p-n junction characteristics : H. Keressel and A. Elsea, Solid-St. Electron.10 (1967), p. 213.
- Publisher
- Elsevier Science
- Year
- 1967
- Tongue
- English
- Weight
- 106 KB
- Volume
- 6
- Category
- Article
- ISSN
- 0026-2714
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