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Determination of the diffusion length of the minority carriers in electron-beam-excited n-type GaAs

✍ Scribed by Rakshit, S. ;Biswas, S. N. ;Chakravarti, A. N.

Publisher: John Wiley and Sons
Year: 1971
Tongue: English
Weight: 397 KB
Volume: 4
Category: Article
ISSN: 0031-8965
DOI: 10.1002/pssa.2210040125

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