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Determination of diffusion induced concentration profiles in Cr2O3films on ceramic Al2O3by Auger sputter depth profiling

✍ Scribed by U. Rothhaar, H. Oechsner

Book ID: 120751755
Publisher: Springer
Year: 1995
Tongue: English
Weight: 266 KB
Volume: 353
Category: Article
ISSN: 1618-2650
DOI: 10.1007/BF00321316

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