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Design of large embedded CMOS PLAs for built-in self-test

✍ Scribed by Liu, D.L.; McCluskey, E.J.

Book ID: 119777811
Publisher: IEEE
Year: 1988
Tongue: English
Weight: 948 KB
Volume: 7
Category: Article
ISSN: 0278-0070
DOI: 10.1109/43.3129

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