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A new approach to the design of built-in self-testing PLAs for high fault coverage

✍ Scribed by Upadhyaya, S.J.; Saluja, K.K.

Book ID: 119777812
Publisher: IEEE
Year: 1988
Tongue: English
Weight: 925 KB
Volume: 7
Category: Article
ISSN: 0278-0070
DOI: 10.1109/43.3130

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