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[IEEE 32nd Midwest Symposium on Circuits and Systems - Champaign, IL, USA (14-16 Aug. 1989)] Proceedings of the 32nd Midwest Symposium on Circuits and Systems - A built-in self-test PLA design with full fault coverage

✍ Scribed by Rajashekhara, T.N.; Nale, A.S.

Book ID: 126735973
Publisher: IEEE
Year: 1990
Weight: 339 KB
Category: Article
DOI: 10.1109/MWSCAS.1989.101791

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