Failure and Coverage Factors Based Markoff Models: A New Approach for Improving the Dependability Estimation in Complex Fault Tolerant Systems Exposed to SEUs

✍ Scribed by Ferreyra, P.A.; Viganotti, G.; Marques, C.A.; Velazco, R.; Ferreyra, R.T.

• Book ID: 121877747
• Publisher: IEEE
• Year: 2007
• Tongue: English
• Weight: 192 KB
• Volume: 54
• Category: Article
• ISSN: 0018-9499
• DOI: 10.1109/TNS.2007.895548