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Design of built-in test generator circuits using width compression

✍ Scribed by Chakrabarty, K.; Murray, B.T.

Book ID: 119778380
Publisher: IEEE
Year: 1998
Tongue: English
Weight: 253 KB
Volume: 17
Category: Article
ISSN: 0278-0070
DOI: 10.1109/43.728923

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