Design & Evaluation Methodology For Built-In-Test
โ Scribed by Lord, Donald H.; Gleason, Daniel
- Book ID
- 117934414
- Publisher
- IEEE
- Year
- 1981
- Tongue
- English
- Weight
- 996 KB
- Volume
- R-30
- Category
- Article
- ISSN
- 0018-9529
No coin nor oath required. For personal study only.
๐ SIMILAR VOLUMES
## Abstract Recently current testing is beginning to be noticed as a testing method for CMOS circuits. However, since CMOS circuits cause the dynamic current due to switching, it has been pointed out that testing at a fast clock rate by current testing is difficult. To cope with this problem a buil
Built-in Current (BIC) sensors have proven to be very useful in testing static CMOS ICs. In a number of experimental ICs BIC sensors were able to detect small abnormal Ioo Q currents. This paper discusses the design of the circuit under test and Built-in Current (BIC) sensors, which provide: maximu