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Depth-resolved strain measurements in thin films by energy-variable X-ray diffraction

✍ Scribed by E. Zolotoyabko; B. Pokroy; T. Cohen-Hyams; J.P. Quintana

Publisher: Elsevier Science
Year: 2006
Tongue: English
Weight: 151 KB
Volume: 246
Category: Article
ISSN: 0168-583X
DOI: 10.1016/j.nimb.2005.12.031

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