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Depth profiling using total reflection X-ray fluorescence spectrometry alone and in combination with ion beam sputtering

✍ Scribed by H Schwenke; J Knoth; R Günther; G Wiener; R Bormann

Book ID: 114254477
Publisher: Elsevier Science
Year: 1997
Tongue: English
Weight: 564 KB
Volume: 52
Category: Article
ISSN: 0584-8547
DOI: 10.1016/s0584-8547(96)01647-3

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