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Depth profiling of organic materials using improved ion beam conditions

✍ Scribed by H.-G. Cramer; T. Grehl; F. Kollmer; R. Moellers; E. Niehuis; D. Rading

Publisher: Elsevier Science
Year: 2008
Tongue: English
Weight: 584 KB
Volume: 255
Category: Article
ISSN: 0169-4332
DOI: 10.1016/j.apsusc.2008.05.028

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