✦ LIBER ✦
The effect of C60 cluster ion beam bombardment in sputter depth profiling of organic–inorganic hybrid multiple thin films
✍ Scribed by Hyun Kyong Shon; Tae Geol Lee; Dahl Hyun Kim; Hee Jae Kang; Byoung Hoon Lee; Myung Mo Sung; Dae Won Moon
- Publisher
- Elsevier Science
- Year
- 2008
- Tongue
- English
- Weight
- 715 KB
- Volume
- 255
- Category
- Article
- ISSN
- 0169-4332
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