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Depth profiling of carriers in ZnSe/GaAs heterostructures by Raman spectroscopy

✍ Scribed by O. Pagés; M.A. Renucci; O. Briot; T. Cloitre; R.L. Aulombard

Publisher: Elsevier Science
Year: 1992
Tongue: English
Weight: 310 KB
Volume: 117
Category: Article
ISSN: 0022-0248
DOI: 10.1016/0022-0248(92)90815-z

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