๐”– Bobbio Scriptorium
โœฆ   LIBER   โœฆ

Depth Profiles of Ion-Induced Structural Changes in Diamond from X-Ray Photoelectron Spectroscopy

โœ Scribed by Evans, S.

Book ID
120151266
Publisher
The Royal Society
Year
1978
Tongue
English
Weight
703 KB
Volume
360
Category
Article
ISSN
0962-8444

No coin nor oath required. For personal study only.

๐Ÿ“œ SIMILAR VOLUMES

Depth-profile analysis from X-ray photoe
Depth-profile analysis from X-ray photoelectron spectroscopy on As-implanted ZnO activated in ozone ambient
โœ T. S. Jeong; J. H. Kim; S. J. Bae; C. J. Youn ๐Ÿ“‚ Article ๐Ÿ“… 2008 ๐Ÿ› John Wiley and Sons ๐ŸŒ English โš– 328 KB

Chemical bonds of As-implanted ZnO annealed in ozone molecular (O 3 ) ambient were analyzed through the x-ray photoelectron spectroscopy as a function of the etching depth. With the etching depth increased to 25 nm from surface, the peaks of Zn2p and O1s core levels shifted toward the low-binding en