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Depth profile analysis of surfaces produced by annealing ultra-thin films of Au deposited on Si(100)

✍ Scribed by G. Yang; J.H. Kim; S. Yang; A.H. Weiss

Book ID: 117216712
Publisher: Elsevier Science
Year: 1996
Tongue: English
Weight: 696 KB
Volume: 367
Category: Article
ISSN: 0039-6028
DOI: 10.1016/s0039-6028(96)00862-x

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