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Depth microscopy for thin film analysis

✍ Scribed by G. Dollinger; M. Boulouednine; T. Faestermann; P. Maier-Komor

Book ID: 103609833
Publisher: Elsevier Science
Year: 1993
Tongue: English
Weight: 303 KB
Volume: 334
Category: Article
ISSN: 0168-9002
DOI: 10.1016/0168-9002(93)90549-w

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