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Depth distribution of defects and impurities in diamond and cubic boron nitride after high-energy ion implantation

✍ Scribed by Burenkov, A. F. ;Varychenko, V. S. ;Zaitsev, A. M. ;Komarov, F. F. ;Konoplyanik, G. G. ;Melnikov, A. A. ;Stelmakh, V. F. ;Tkachev, V. V.

Publisher: John Wiley and Sons
Year: 1989
Tongue: English
Weight: 505 KB
Volume: 115
Category: Article
ISSN: 0031-8965
DOI: 10.1002/pssa.2211150208

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