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Dependence of ionization current on gate bias in GaAs MESFETs

✍ Scribed by Canali, C.; Neviani, A.; Tedesco, C.; Zanoni, E.; Centronio, A.; Lanzieri, C.


Book ID
114535029
Publisher
IEEE
Year
1993
Tongue
English
Weight
409 KB
Volume
40
Category
Article
ISSN
0018-9383

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