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Degradation of critical current by the mixed strain of bending and tension in Bi-2223/Ag HTS tape

✍ Scribed by Sang-Soo Oh; Dong-Woo Ha; John Ryan C. Dizon; Ki-Hyun Kim; Hyung-Seop Shin

Publisher: Elsevier Science
Year: 2005
Tongue: English
Weight: 270 KB
Volume: 426-431
Category: Article
ISSN: 0921-4534
DOI: 10.1016/j.physc.2005.04.037

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