Degradation behavior of critical current in Bi-2223 tapes in bending–tension strain mode
✍ Scribed by Hyung-Seop Shin; Sang-Soo Oh; Dong-Woo Ha
- Publisher
- Elsevier Science
- Year
- 2004
- Tongue
- English
- Weight
- 439 KB
- Volume
- 412-414
- Category
- Article
- ISSN
- 0921-4534
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📜 SIMILAR VOLUMES
Unlike in the tests under tension, transverse compression and torsion, the bending test of HTS tapes requires lots of time and effort since the sample should be bent or mounted successively onto sample holders having different bending radius at room temperature, and then cooled down to measure the c
It was attempted to estimate the distribution of irreversible bending strain for critical current of the Bi2223 composite tape. In the modeling, the shape of the core composed of the current transporting Bi2223 filaments and Ag, and the damage strain parameter given by the difference between the int
Tensile test was carried out for Bi2223/Ag/Ag alloy composite tapes at RT, 77 and 7 K. Two yielding points are observed in the stress-strain curves. From the stress-strain behavior of the components and critical current (I c ) as a function of tensile strain, it was found that the microscopic reason