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Degradation behavior of critical current in Bi-2223 tapes in bending–tension strain mode

✍ Scribed by Hyung-Seop Shin; Sang-Soo Oh; Dong-Woo Ha


Publisher
Elsevier Science
Year
2004
Tongue
English
Weight
439 KB
Volume
412-414
Category
Article
ISSN
0921-4534

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