As the stress-induced damage evolution is different from position to position in the sample, the local critical current is scattered in a sample, affecting on the overall current. The present work aimed to describe the distribution of local critical current and its relation to overall critical curre
Local and overall critical current of Bi2223-composite tape under applied tensile and bending strains
β Scribed by J.K. Shin; M. Fujimoto; S. Ochiai; H. Okuda; S.S. Oh
- Publisher
- Elsevier Science
- Year
- 2007
- Tongue
- English
- Weight
- 435 KB
- Volume
- 463-465
- Category
- Article
- ISSN
- 0921-4534
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β¦ Synopsis
Local and overall transport critical current I C and n-value at 77 K of multifilamentary Bi2223-composite tape were studied under applied tensile and bending strains. The I C and n-value of the local elements constituting of the overall sample and those of the overall sample were measured for the voltage probe distances 10 and 60 mm, respectively. The local I C as well as n-value varied along the sample length under both tensile and bending strains, while the critical current reduction process under the tensile strain was quite different from that under bending one; a big difference in damage among the local elements was found under tensile strain but not under bending one. While the damage process was different between the tensile and bending strains, the relation of overall I C and n-value to the local ones was described comprehensively by the voltage summation model. From the analysis of the experimentally observed critical currentapplied strain relation of the local elements, the variation of the critical current determining factor ''fracture strain-residual strain'' along the sample length was revealed.
π SIMILAR VOLUMES
It was attempted to estimate the distribution of irreversible bending strain for critical current of the Bi2223 composite tape. In the modeling, the shape of the core composed of the current transporting Bi2223 filaments and Ag, and the damage strain parameter given by the difference between the int