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Defects in sputter-deposited aluminium films, studied by X-ray diffraction and positron annihilation

✍ Scribed by N. Nancheva; P. Docheva; N. Feschiev; M. Misheva; N. Djourelov

Book ID: 116165091
Publisher: Elsevier Science
Year: 1995
Weight: 549 KB
Volume: 33
Category: Article
ISSN: 0956-716X
DOI: 10.1016/0956-716x(95)00287-6

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