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X-ray diffraction and EXAFS studies of sputter-deposited TiPd films

✍ Scribed by M Yamada; H Tsunoda; K Tanaka; K Sumiyama

Publisher: Elsevier Science
Year: 1991
Tongue: English
Weight: 244 KB
Volume: 134
Category: Article
ISSN: 0921-5093
DOI: 10.1016/0921-5093(91)90904-2

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