✦ LIBER ✦
Postgrowth annealing of defects in ZnO studied by positron annihilation, x-ray diffraction, Rutherford backscattering, cathodoluminescence, and Hall measurements
✍ Scribed by Chen, Z. Q.; Yamamoto, S.; Maekawa, M.; Kawasuso, A.; Yuan, X. L.; Sekiguchi, T.
- Book ID
- 115526089
- Publisher
- American Institute of Physics
- Year
- 2003
- Tongue
- English
- Weight
- 315 KB
- Volume
- 94
- Category
- Article
- ISSN
- 0021-8979
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