✦ LIBER ✦

Defect identification in vapour-grownβ-SiC whiskers

✍ Scribed by H. Iwanaga; T. Yoshiie; H. Katuki; M. Egashira; S. Takeuchi

No coin nor oath required. For personal study only.

📜 SIMILAR VOLUMES

Stacking fault probability in β-SiC grow

✍ Yang-Ming Lu; Min-Hsiung Hon 📂 Article 📅 1991 🏛 Elsevier Science 🌐 English ⚖ 812 KB

Defects in vapour-grown silicon layers

✍ K.O. Batsford; D.J.D. Thomas 📂 Article 📅 1962 🏛 Elsevier Science 🌐 English ⚖ 201 KB

Defects in epitaxially vapour grown germ

✍ J.R. Dale 📂 Article 📅 1962 🏛 Elsevier Science 🌐 English ⚖ 172 KB

A study of contrast bands in β-SiC whisk

✍ J.J. Comer 📂 Article 📅 1969 🏛 Elsevier Science 🌐 English ⚖ 581 KB

Chemical vapour growth of β-SiC whiskers

✍ Seiji Motojima; Mitsutaka Hasegawa; Tatsuhiko Hattori 📂 Article 📅 1988 🏛 Elsevier Science 🌐 English ⚖ 648 KB

Radiation induced defects in CVD-grown 3

✍ Itoh, H.; Yoshikawa, M.; Nashiyama, I.; Misawa, S.; Okumura, H.; Yoshida, S. 📂 Article 📅 1990 🏛 IEEE 🌐 English ⚖ 659 KB