๐”– Bobbio Scriptorium
โœฆ   LIBER   โœฆ

Defect evolution in ion implanted crystalline Si probed by in situ conductivity measurements

โœ Scribed by A. Battaglia; S. Coffa; F. Priolo; C. Spinella; S. Libertino


Book ID
113284915
Publisher
Elsevier Science
Year
1995
Tongue
English
Weight
501 KB
Volume
96
Category
Article
ISSN
0168-583X

No coin nor oath required. For personal study only.


๐Ÿ“œ SIMILAR VOLUMES