We present the results of the simulation of dc and microwave performance of a GaN/AlGaN heterostructure field effect transistors and compare the results with recent record-breaking experimental data from Cree Research, Inc. Our simulation results are in good agreement with the data on the small sign
✦ LIBER ✦
DC and microwave performance of high-current AlGaN/GaN heterostructure field effect transistors grown on p-type SiC substrates
✍ Scribed by Ping, A.T.; Chen, Q.; Yang, J.W.; Khan, M.A.; Adesida, I.
- Book ID
- 121410202
- Publisher
- IEEE
- Year
- 1998
- Tongue
- English
- Weight
- 92 KB
- Volume
- 19
- Category
- Article
- ISSN
- 0741-3106
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## Abstract The authors compared DC and microwave performance of AlGaN/GaN heterojunction field‐effect transistors (HFETs) fabricated on epitaxial structures with different thickness of GaN buffer layer. The structures were grown by low‐pressure metal‐organic vapour phase epitaxy on semi‐insulating