𝔖 Bobbio Scriptorium
✦   LIBER   ✦

Current testing in dynamic CMOS circuits

✍ Scribed by J. Figueras; M. Renovell

Book ID
105029088
Publisher
Springer US
Year
1995
Tongue
English
Weight
350 KB
Volume
6
Category
Article
ISSN
0923-8174

No coin nor oath required. For personal study only.

πŸ“œ SIMILAR VOLUMES

Built-in current testing for CMOS logic
Built-in current testing for CMOS logic circuits using random patterns
✍ Hiroshi Yokoyama; Hideo Tamamoto; Yuichi Narita πŸ“‚ Article πŸ“… 1994 πŸ› John Wiley and Sons 🌐 English βš– 829 KB

## Abstract With respect to CMOS logic circuits, it is reported that a fault can occur cannot be covered by conventional classical fault model, and the current testing is considered to be interesting as a testing method to detect such a fault. This paper proposes a fault‐detection method for the C

CMOS current comparator circuit
CMOS current comparator circuit
✍ Freitas, D.A.; Current, K.W. πŸ“‚ Article πŸ“… 1983 πŸ› The Institution of Electrical Engineers 🌐 English βš– 429 KB
Multi-Voltage CMOS Circuit Design (Kursu
Multi-Voltage CMOS Circuit Design (Kursun/Multi-Voltage CMOS Circuit Design) || Subthreshold Leakage Current Characteristics of Dynamic Circuits
✍ Kursun, Volkan; Friedman, Eby G. πŸ“‚ Article πŸ“… 2006 πŸ› John Wiley & Sons, Ltd 🌐 English βš– 501 KB

Subthreshold leakage power is expected to dominate the total power consumption of a CMOS circuit in the near future as depicted in Figure 10. 1 [5], [21], [29], [33]-[37]. Energy-efficient circuit techniques aimed at lowering leakage currents are, therefore, highly desirable. The subthreshold leakag