Supply current monitoring in cmos circuits for reliability prediction and test
β Scribed by A. M. Richardson; A. P. Dorey
- Book ID
- 112184797
- Publisher
- John Wiley and Sons
- Year
- 1992
- Tongue
- English
- Weight
- 419 KB
- Volume
- 8
- Category
- Article
- ISSN
- 0748-8017
No coin nor oath required. For personal study only.
π SIMILAR VOLUMES
## Abstract With respect to CMOS logic circuits, it is reported that a fault can occur cannot be covered by conventional classical fault model, and the current testing is considered to be interesting as a testing method to detect such a fault. This paper proposes a faultβdetection method for the C
## Abstract Recently current testing is beginning to be noticed as a testing method for CMOS circuits. However, since CMOS circuits cause the dynamic current due to switching, it has been pointed out that testing at a fast clock rate by current testing is difficult. To cope with this problem a buil