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Crystal defects in silicon solar cells--I. X-ray observations

✍ Scribed by H.J. Queisser; G.H. Schwuttke


Publisher
Elsevier Science
Year
1963
Tongue
English
Weight
107 KB
Volume
6
Category
Article
ISSN
0038-1101

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## Abstract Using the modified method of limited X‐ray topographs the distribution of defects along the silicon dendritic thickness was investigated. It is found that there are two dislocation sources in the given crystals, one of which acts near the surface and generates the loop‐shaped dislocatio