Direct Observation of Dislocations in Silicon Single Crystals Using a White X-Ray Radiation Technique

✍ Scribed by L. Fiermans

• Publisher: John Wiley and Sons
• Year: 1964
• Tongue: English
• Weight: 976 KB
• Volume: 6
• Category: Article
• ISSN: 0370-1972
• DOI: 10.1002/pssb.19640060115