## Abstract Transmission electron microscopy (TEM) is revisited in order to define methods for the identification of nanometric defects. Nanometric crystal defects play an important role as they influence, generally in a detrimental way, physical properties. For instance, radiation‐induced damage i
✦ LIBER ✦
Crystal defects in silicon solar cells—II. Transmission electron microscopy
✍ Scribed by H.J. Queisser; G. Thomas; J. Washburn
- Publisher
- Elsevier Science
- Year
- 1963
- Tongue
- English
- Weight
- 212 KB
- Volume
- 6
- Category
- Article
- ISSN
- 0038-1101
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