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Accelerated Ageing Tests of Solar Cells : An In Situ Transmission Electron Microscopy Study

✍ Scribed by Dietmar Lütke; Holger H. Kuehnlein; Han Verbunt; Stephan Irsen

Publisher
Wiley (John Wiley & Sons)
Year
2009
Weight
566 KB
Volume
11
Category
Article
ISSN
1439-4243

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✦ Synopsis

In situ transmission electron microscopy was used to investigate the ageing behaviour of Si-based solar cells. The structural and compositional changes of the NiSi layer of such cells were determined. ageing tests. Figures 1B-D show the changes of the sample after t = 15, 60 and 120 min. Already after 15 min an additional layer is formed and grows permanently over the heating period.

The mean thickness of the newly formed layer was about 40 nm while the origi-

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