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Cross-sectional transmission electron microscopy study of the structure of titanium diffusion barriers on (100) silicon

✍ Scribed by J.T. McGinn; J.-S. Maa; C.J. Buiocchi


Publisher
Elsevier Science
Year
1989
Tongue
English
Weight
469 KB
Volume
111
Category
Article
ISSN
0921-5093

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