✦ LIBER ✦

Copper metallizations for integrated circuits: tem analysis and electrical characterization

✍ Scribed by P. Bruschi; C. Ciofi; V. Dattilo; A. Diligenti; A. Nannini; B. Neri

No coin nor oath required. For personal study only.

📜 SIMILAR VOLUMES

Optical ammeter for integrated circuit c

✍ W. Claeys; S. Dilhaire; D. Lewis; V. Quintard; T. Phan; J. L. Aucouturier 📂 Article 📅 1995 🏛 John Wiley and Sons 🌐 English ⚖ 481 KB

Electrical modeling and characterization

✍ Ioannis Savidis; Syed M. Alam; Ankur Jain; Scott Pozder; Robert E. Jones; Ritwik 📂 Article 📅 2010 🏛 Elsevier Science 🌐 English ⚖ 541 KB

[IEEE 2012 19th IEEE International Sympo

✍ Esa, Siti Rahmah; Yahya, Rosiyah; Hassan, Aziz; Omar, Ghazali 📂 Article 📅 2012 🏛 IEEE ⚖ 65 KB

Nanoparticles and plasmon resonance base

✍ Shahmoon, Asaf; Meiri, Amihai; Livshits, Pavel; Zalevsky, Zeev 📂 Article 📅 2013 🏛 Elsevier Science 🌐 English ⚖ 664 KB

Electrical characterization of packages

📂 Article 📅 1987 🏛 Elsevier Science 🌐 English ⚖ 121 KB

New failure analysis techniques for beam

📂 Article 📅 1977 🏛 Elsevier Science 🌐 English ⚖ 96 KB