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Control of threshold-voltage and short-channel effects in ultrathin strained-SOI CMOS devices

โœ Scribed by Numata, T.; Mizuno, T.; Tezuka, T.; Koga, J.; Takagi, S.


Book ID
114617894
Publisher
IEEE
Year
2005
Tongue
English
Weight
497 KB
Volume
52
Category
Article
ISSN
0018-9383

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